Scanning x‐ray radiography: First tests in an electron spectrometer
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.330985
Reference8 articles.
1. The Scanning X-Ray Microscope
2. A Scanning X-Ray Microscope Using Synchrotron Radiation
3. Microanalyse par radiographie X à balayage et fluorescence X : une conception nouvelle
4. Electron spectroscopy for bulk and surface microscopy and microanalysis
5. Electron spectroscopy for bulk and surface microscopy and microanalysis
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1. Characteristic and continuous fluorescence correction for electron probe microanalysis of thin coatings at oblique incidence;Journal of Analytical Atomic Spectrometry;1996
2. X-ray photoelectron spectroscopy;Clay Mineralogy: Spectroscopic and Chemical Determinative Methods;1994
3. Historical perspective and current trends in emission microscopy, mirror electron microscopy and low-energy electron microscopy;Ultramicroscopy;1991-05
4. Experiments on imaging X-ray analytical methods;Surface and Interface Analysis;1989-04
5. Imaging XPS—a new technique. 2—Experimental verification;Surface and Interface Analysis;1987-06
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