Charge trapping in polymer transistors probed by terahertz spectroscopy and scanning probe potentiometry
Author:
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.2340057
Reference15 articles.
1. Device Physics of Solution-Processed Organic Field-Effect Transistors
2. Light-induced bias stress reversal in polyfluorene thin-film transistors
3. Bipolaron mechanism for bias-stress effects in polymer transistors
4. Kinetics of bias stress and bipolaron formation in polythiophene
5. Reversible and irreversible trapping at room temperature in poly(thiophene) thin-film transistors
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