Measuring one-dimensional and two-dimensional impurity density profiles on TEXTOR using combined charge exchange-beam emission spectroscopy and ultrasoft x-ray tomography-Reference-Cited by-同舟云学术

Measuring one-dimensional and two-dimensional impurity density profiles on TEXTOR using combined charge exchange-beam emission spectroscopy and ultrasoft x-ray tomography

Published:2004-10 Issue:10 Volume:75 Page:4155-4157
ISSN:0034-6748
Container-title:Review of Scientific Instruments
language:en
Short-container-title:

Author:

De Bock M.¹,Jakubowska K.¹,Hellermann M. von¹,Jaspers R.¹,Donné A. J. H.¹,Shmaenok L.²

Affiliation:

1. FOM-Institute for Plasma Physics Rijnhuizen, Association EURATOM-FOM, member of Trilateral Euregio Cluster, PO Box 1207, 3430 BE Nieuwegein, The Netherlands

2. Phystex, The Netherlands and A. F. Ioffe Physical-Technical Institute, Polytechnicheskaya 26, 194021 St. Petersburg, Russia

Publisher

AIP Publishing

Subject

Instrumentation

Reference9 articles.

1. Radiative edges under control by impurity fluxes

2. An overview of charge-exchange spectroscopy as a plasma diagnostic

3. A. Boieau et al., J. Phys. B 22, 145 (1989).JPAPEH0953-4075

4. Magnetic field pitch-angle measurments in the PBX-M tokamak using the motional Stark effect

5. Beam emission spectroscopy as a comprehensive plasma diagnostic tool

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