Composite degradation model and corresponding failure mechanism for mid-power GaN-based white LEDs-Reference-Cited by-同舟云学术

Composite degradation model and corresponding failure mechanism for mid-power GaN-based white LEDs

Published:2018-06 Issue:6 Volume:8 Page:065108
ISSN:2158-3226
Container-title:AIP Advances
language:en
Short-container-title:AIP Advances

Author:

Cao Haicheng¹²,Ma Zhanhong¹²,Sun Baojuan¹,Sun Xuejiao¹²,Yang Chao¹²,Li Xiaodong¹,Wang Junxi¹,Zhao Lixia¹²

Affiliation:

1. Semiconductor Lighting Research and Development Center, Institute of Semiconductors, Chinese Academy of Sciences, Beijing 100083, P. R. China

2. College of Materials Sciences and Opto-Electronic Technology, University of Chinese Academy of Sciences, Beijing 100049, P. R. China

Funder

National Basic Research and High Technology Program of China

National Natural Science Foundation of China

Publisher

AIP Publishing

Subject

General Physics and Astronomy

Link

http://aip.scitation.org/doi/pdf/10.1063/1.5027783

Reference33 articles.

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5. Heat and fluid flow in high-power LED packaging and applications

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