Analyses of low-temperature transport and thermoelectric properties of polycrystalline undoped n-ZrNiSn
Author:
Affiliation:
1. Interdisciplinary Faculty of Science and Engineering, Shimane University, Matsue 690-8504, Japan
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
https://aip.scitation.org/doi/pdf/10.1063/5.0049943
Reference81 articles.
1. Shallow impurity band in ZrNiSn
2. Resolving the true band gap of ZrNiSn half-Heusler thermoelectric materials
3. The intrinsic disorder related alloy scattering in ZrNiSn half-Heusler thermoelectric materials
4. Engineering half-Heusler thermoelectric materials using Zintl chemistry
5. Revealing the Intrinsic Electronic Structure of 3D Half‐Heusler Thermoelectric Materials by Angle‐Resolved Photoemission Spectroscopy
Cited by 8 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
1. Nernst Effect of High-Mobility Weyl Electrons in NdAlSi Enhanced by a Fermi Surface Nesting Instability;Physical Review X;2024-04-16
2. The Dominant Effects of Hopping Conduction on the Seebeck Coefficient and the Hall Mobility in p-Type CuInTe2 and CuGaTe2;Journal of Electronic Materials;2023-10-13
3. Analyses of Electrical Transport Properties of p-Type Cu2GeSe3 Taking into Account Hopping Conduction Mechanisms;Journal of Electronic Materials;2023-10-09
4. Algorithm for Calibrating Effective Mass Parameters to consider Quantum Confinement Effects in Ultra-Thin-Body Devices for Various Temperatures;Journal of Electronic Materials;2023-10-04
5. Amphoteric-Dopant Model Applied to Multiband Analysis of Electrical Transport Properties of n-Type PdxCu1−xFeS2 Including an Impurity Band;Journal of Electronic Materials;2023-05-30
1.学者识别学者识别
2.学术分析学术分析
3.人才评估人才评估
"同舟云学术"是以全球学者为主线,采集、加工和组织学术论文而形成的新型学术文献查询和分析系统,可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容,当前同舟云学术共收录了国内外主流学术期刊6万余种,收集的期刊论文及会议论文总量共计约1.5亿篇,并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询!咨询电话:010-8811{复制后删除}0370
www.globalauthorid.com
TOP
Copyright © 2019-2024 北京同舟云网络信息技术有限公司 京公网安备11010802033243号 京ICP备18003416号-3