Hydrogen passivation of defects in silicon ribbon grown by the edge‐defined film‐fed growth process
Author:
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.94022
Reference4 articles.
1. Passivation of grain boundaries in polycrystalline silicon
2. Electron-Beam-Induced Currents in Semiconductors
3. Passivation of grain boundaries in silicon
4. First and second order twin boundaries in edge defined film growth silicon ribbon
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