Concentration‐depth profiling using total‐reflection x‐ray fluorescence spectrometry in combination with ion‐beam microsectioning techniques
Author:
Publisher
AIP Publishing
Subject
Instrumentation
Link
http://aip.scitation.org/doi/pdf/10.1063/1.1145260
Reference15 articles.
1. Influence of Cu as an impurity in Al/Ti and Al/W thin‐film reactions
2. Thin-film reactions of Au with Ti, Zr, V, and Nb
3. Effect of Cu on the Kinetics and Microstructure of Al3Ti Formation
4. Solute effect of Cu on interdiffusion inAl3Ti compound films
5. Ar+-induced mixing mechanisms in metal-metal bilayer systems
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