Model-free iterative control of repetitive dynamics for high-speed scanning in atomic force microscopy
Author:
Publisher
AIP Publishing
Subject
Instrumentation
Link
http://aip.scitation.org/doi/pdf/10.1063/1.3065093
Reference19 articles.
1. A Survey of Control Issues in Nanopositioning
2. Vibration compensation for high speed scanning tunneling microscopy
3. Feedforward control of a closed-loop piezoelectric translation stage for atomic force microscope
4. Making high resolution positioning independent of scan rates: A feedback approach
5. A survey of iterative learning control
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