Time-of-flight analyzer system to detect reflected particles from a solid surface following low-energy particle injection-Reference-Cited by-同舟云学术

Time-of-flight analyzer system to detect reflected particles from a solid surface following low-energy particle injection

Published:2008 Issue:2 Volume:79 Page:02C701
ISSN:0034-6748
Container-title:Review of Scientific Instruments
language:en
Short-container-title:Rev. Sci. Instrum.

Author:

Yamaoka H.,Tanaka N.,Tsumori K.,Nishiura M.,Kenmotsu T.,Hirouchi T.,Kisaki M.,Shinto K.,Sasao M.,Matsumoto Y.,Wada M.

Publisher

AIP Publishing

Subject

Instrumentation

Reference12 articles.

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3. Development of an angular-resolved momentum analyzer system to study particle reflections from solid surfaces

4. Particle reflections of low energy light ions from a vanadium alloy (V–4Cr–4Ti)

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