Comparing the kinetics of bias stress in organic field-effect transistors with different dielectric interfaces
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.2358410
Reference34 articles.
1. Device Physics of Solution-Processed Organic Field-Effect Transistors
2. Bipolaron mechanism for bias-stress effects in polymer transistors
3. Kinetics of bias stress and bipolaron formation in polythiophene
4. Bias-stress induced instability of organic thin film transistors
5. Charge trapping instabilities of sexithiophene Thin Film Transistors
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