Electrical delay technique in the picosecond thermoreflectance method for thermophysical property measurements of thin films
Author:
Publisher
AIP Publishing
Subject
Instrumentation
Link
http://aip.scitation.org/doi/pdf/10.1063/1.2038628
Reference23 articles.
1. Transient thermoreflectance from thin metal films
2. Picosecond optical studies of amorphous diamond and diamondlike carbon: Thermal conductivity and longitudinal sound velocity
3. THERMAL BOUNDARY RESISTANCE MEASUREMENTS USING A TRANSIENT THERMOREFLECTANCE TECHNIQUE
4. Thermometry and Thermal Transport in Micro/Nanoscale Solid-State Devices and Structures
5. Development of a thermal diffusivity measurement system with a picosecond thermoreflectance technique
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