Investigation of hydrogen-induced degradation in Pb(ZrxTi1−x)O3 thin film capacitors for the application of memory devices
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.1499976
Reference16 articles.
1. Electrode dependence of hydrogen-induced degradation in ferroelectric Pb(Zr,Ti)O3 and SrBi2Ta2O9 thin films
2. H2 damage of ferroelectric Pb(Zr,Ti)O3 thin-film capacitors—The role of catalytic and adsorptive activity of the top electrode
3. The effects of the catalytic nature of capacitor electrodes on the degradation of ferroelectric Pb(Zr,Ti)O3 thin films during reductive ambient annealing
4. Adsorption of hydrogen on a Pt(111) surface
5. Ab initio theoretical study on the reactions of a hydrogen molecule with small platinum clusters: A model for chemisorption on a Pt surface
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