Sub-nA spatially resolved conductivity profiling of surface and interface defects in ceria films-Reference-Cited by-同舟云学术

Sub-nA spatially resolved conductivity profiling of surface and interface defects in ceria films

Author:

Farrow Tim¹,Yang Nan²,Doria Sandra³,Belianinov Alex⁴,Jesse Stephen⁴,Arruda Thomas M.⁵,Balestrino Giuseppe³,Kalinin Sergei V.⁴^ORCID,Kumar Amit¹

Affiliation:

1. Centre for Nanostructured Media, School of Mathematics and Physics, Queen’s University Belfast, Belfast BT7 1NN, United Kingdom

2. CNR-SPIN and Engineering Faculty, Università degli studi Niccolò Cusano, Rome I-00166, Italy

3. CNR-SPIN and DICCI Dipartiment, Università di Roma Tor Vergata, Via del Politecnico 1, I-00133 Rome, Italy

4. Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831, USA

5. Chemistry Department, Salve Regina University, Newport, Rhode Island 02840, USA

Funder

Royal Society

Publisher

AIP Publishing

Subject

General Engineering,General Materials Science

Link

Reference45 articles.

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