X-ray diffraction on La3Ga5SiO14 crystal modulated by SAW near the K absorption edge of Ga

Author:

Roshchupkin Dmitry1ORCID,Ortega Luc2ORCID,Vadilonga Simone3ORCID,Zizak Ivo4ORCID,Emelin Eugenii1,Plotitcyna Olga1,Thiaudière Dominique5,Leitenberger Wolfram6,Formoso Vincenzo7ORCID,Fettar Farid8

Affiliation:

1. Institute of Microelectronics Technology and High Purity Materials Russian Academy of Sciences, 142432 Chernogolovka, Moscow District, Russia

2. Institut Néel, F-38000 Grenoble, France

3. Helmholtz-Zentrum Berlin für Materialien und Energie GmbH, Albert-Einstein Strasse 15, 12489 Berlin, Germany

4. Institute for Nanometre Optics and Technology, Helmholtz-Zentrum Berlin für Materialien und Energie GmbH, Albert-Einstein Strasse 15, 12489 Berlin, Germany

5. Synchrotron SOLEIL, L'Orme des Merisiers Saint-Aubin, BP 48 91192 Gif-sur-Yvette Cedex, France

6. Universität Potsdam, Karl Liebknecht Str. 24-25, 14471 Potsdam, Germany

7. Università degli Studi della Calabria-Dipartimento di Fisica, 87036 Rende, Italy

8. CNRS/University Grenoble Alpes, F-38000 Grenoble, France

Publisher

AIP Publishing

Subject

Physics and Astronomy (miscellaneous)

Cited by 1 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. X-ray diffraction by surface acoustic waves;Journal of Applied Crystallography;2021-02-01

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