Identification of the misfit dislocations at an FeAl/AlAs/GaAs interface using moiré fringe contrast in a transmission electron microscope
Author:
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.105523
Reference8 articles.
1. Stability and epitaxy of NiAl and related intermetallic films on III‐V compound semiconductors
2. Stable and epitaxial metal/III-V semiconductor heterostructures
3. Characterization of the CoGa/GaAs interface
4. Growth and characterization of iron aluminide films on compound semiconductors
5. Detection of dislocation by the Moiré pattern in electron micrographs
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