PIXE x rays: From Z=4 to Z=92
Author:
Publisher
AIP Publishing
Subject
Instrumentation
Link
http://aip.scitation.org/doi/pdf/10.1063/1.1143578
Reference5 articles.
1. X‐ray response of silicon surface‐barrier diodes at 8 and 17.5 keV: Evidence that the x‐ray sensitive depth is not generally the depletion depth
2. Soft x‐ray imaging instrument for the Alcator A tokamak
3. Analytical application of particle induced X-ray emission
4. Proton induced X-ray emission as a tool for trace element analysis
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1. The Use of Medium-Energy Atom Beams for Solid-State PIXE Diagnostics;Technical Physics;2021-01
2. On the angular dependence of L X-ray intensity ratios for Au following photoionization;Radiation Physics and Chemistry;2017-04
3. Comparative study of x‐ray sources characterizing x‐ray instrumentation;Review of Scientific Instruments;1995-01
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