Measurement of surface reflection coefficients via multiple reflection of microwaves
Author:
Publisher
AIP Publishing
Subject
Instrumentation
Link
http://aip.scitation.org/doi/pdf/10.1063/1.1144578
Reference23 articles.
1. Fluctuation measurements in the DIII‐D and TEXT tokamaks via collective scattering and reflectometry
2. A new method for obtaining antenna gain from backscatter measurements
3. Accurate determination of gain and radiation patterns by radar cross-section measurements
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