Electro-optical measurements of picosecond bunch length of a 45 MeV electron beam
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.1358322
Reference12 articles.
1. System for direct measurement of the step response of electronic devices on the picosecond time scale
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1. Data analysis scheme for correcting general misalignments of an optics configuration for a voltage measurement system based on the Pockels electro-optic effect;Review of Scientific Instruments;2021-04-01
2. Electron bunch length monitors using spatially encoded electro-optical technique;Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment;2011-05
3. Characterization of the arrival time jitter at the MAX-lab test-FEL using electro-optical spectral decoding;Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment;2011-01
4. Electron bunch length monitors using spatially encoded electro-optical technique in an orthogonal configuration;Applied Physics Letters;2009-12-07
5. Electro-optical sampling at near-zero optical bias;Applied Physics Letters;2006-06-19
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