Optical detection of deep electron traps in poly(p-phenylene vinylene) light-emitting diodes-Reference-Cited by-同舟云学术

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Optical detection of deep electron traps in poly(p-phenylene vinylene) light-emitting diodes

Published:2011-10-31 Issue:18 Volume:99 Page:183305
ISSN:0003-6951
Container-title:Applied Physics Letters
language:en
Short-container-title:Appl. Phys. Lett.

Author:

Kuik Martijn,Vandenbergh Joke,Goris Ludwig,Begemann Eline J.,Lutsen Laurence,Vanderzande Dirk J. M.,Manca Jean V.,Blom Paul W. M.

Publisher

AIP Publishing

Subject

Physics and Astronomy (miscellaneous)

Link

http://aip.scitation.org/doi/pdf/10.1063/1.3656713

Reference28 articles.

1. Electron and hole transport in poly(p‐phenylene vinylene) devices

2. Trap-limited electron transport in disordered semiconducting polymers

3. Carrier deep‐trapping mobility‐lifetime products in poly(p‐phenylene vinylene)

4. Determination of the trap-assisted recombination strength in polymer light emitting diodes

5. Trap-assisted and Langevin-type recombination in organic light-emitting diodes

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