Noncontact atomic force microscopy: Stability criterion and dynamical responses of the shift of frequency and damping signal
Author:
Publisher
AIP Publishing
Subject
Instrumentation
Link
http://aip.scitation.org/doi/pdf/10.1063/1.1564274
Reference21 articles.
1. Atomic Resolution of the Silicon (111)-(7×7) Surface by Atomic Force Microscopy
2. Defect Motion on an InP(110) Surface Observed with Noncontact Atomic Force Microscopy
3. Observation of Silicon Surfaces Using Ultrahigh-Vacuum Noncontact Atomic Force Microscopy
4. Aspects of dynamic force microscopy on NaCl/Cu(111): resolution, tip-sample interactions and cantilever oscillation characteristics
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