Development of a synchrotron biaxial tensile device for in situ characterization of thin films mechanical response-Reference-Cited by-同舟云学术

Development of a synchrotron biaxial tensile device for in situ characterization of thin films mechanical response

Published:2010-10 Issue:10 Volume:81 Page:103903
ISSN:0034-6748
Container-title:Review of Scientific Instruments
language:en
Short-container-title:Review of Scientific Instruments

Author:

Geandier G.,Thiaudière D.,Randriamazaoro R. N.,Chiron R.,Djaziri S.,Lamongie B.,Diot Y.,Le Bourhis E.,Renault P. O.,Goudeau P.,Bouaffad A.,Castelnau O.,Faurie D.,Hild F.

Publisher

AIP Publishing

Subject

Instrumentation

Link

http://aip.scitation.org/doi/pdf/10.1063/1.3488628

Reference37 articles.

1. Mechanical properties of nanocrystalline materials

2. Atomic-scale simulations of the mechanical deformation of nanocrystalline metals

3. The strongest size

4. Deformation in nanocrystalline metals

5. Surface tension effect on the mechanical properties of nanomaterials measured by atomic force microscopy

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