Probing the limits of Si:P δ-doped devices patterned by a scanning tunneling microscope in a field-emission mode-Reference-Cited by-同舟云学术

登录注册会员服务联系我们

Probing the limits of Si:P δ-doped devices patterned by a scanning tunneling microscope in a field-emission mode

Published:2014-10-20 Issue:16 Volume:105 Page:163110
ISSN:0003-6951
Container-title:Applied Physics Letters
language:en
Short-container-title:Appl. Phys. Lett.

Author:

Rudolph M.¹,Carr S. M.¹,Subramania G.¹²,Ten Eyck G.¹,Dominguez J.¹,Pluym T.,Lilly M. P.¹³,Carroll M. S.¹,Bussmann E.¹

Affiliation:

1. Sandia National Laboratories, Albuquerque, New Mexico 87185, USA

2. Department of Electrical and Computer Engineering, University of New Mexico, Albuquerque, New Mexico 87131, USA

3. Center for Integrated Nanotechnologies, Sandia National Laboratories, Albuquerque, New Mexico 87185, USA

Funder

Sandia National Laboratories, National Nuclear Security Administration

Publisher

AIP Publishing

Subject

Physics and Astronomy (miscellaneous)

Link

http://aip.scitation.org/doi/am-pdf/10.1063/1.4899255

Reference25 articles.

1. A silicon-based nuclear spin quantum computer

2. A single-atom transistor

3. Spectroscopy of few-electron single-crystal silicon quantum dots

4. Charge Sensing of Precisely Positioned P Donors in Si

5. Spin readout and addressability of phosphorus-donor clusters in silicon

Cited by 6 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Design and implementation of a device based on an off-axis parabolic mirror to perform luminescence experiments in a scanning tunneling microscope;Review of Scientific Instruments;2022-04-01

2. Scanning Microwave Impedance Microscopy (sMIM) in Electronic and Quantum Materials;Electrical Atomic Force Microscopy for Nanoelectronics;2019

3. All-optical lithography process for contacting nanometer precision donor devices;Applied Physics Letters;2017-11-06

4. Determining the resolution of scanning microwave impedance microscopy using atomic-precision buried donor structures;Applied Surface Science;2017-11

5. Atom-by-Atom Construction of a Quantum Device;ACS Nano;2017-03-10

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370

www.globalauthorid.com

TOP

Copyright © 2019-2024 北京同舟云网络信息技术有限公司
京公网安备11010802033243号京ICP备18003416号-3