Light scattering from dislocations in silicon
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.3506521
Reference15 articles.
1. Multistage Photoionization Chamber with Different Electrode Distances for the Measurement of the Absolute Intensity in the Vacuum Ultraviolet
2. Observation of growth defects in synthetic quartz crystals by light-scattering tomography
3. Observation of Lattice Defects in GaAs and Heat-treated Si Crystals by Infrared Light Scattering Tomography
4. Minimum Size of Oxygen Precipitates in Czochralski Silicon Wafers Detected by Improved Light Scattering Tomography
5. Light scattering from defects in crystals: Scattering by dislocations
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