Electron-beam irradiation of photopolymerized C60 film studied using in situ scanning tunneling microscope, in situ Fourier-transform infrared spectroscopy, and first-principles calculations-Reference-Cited by-同舟云学术

Electron-beam irradiation of photopolymerized C60 film studied using in situ scanning tunneling microscope, in situ Fourier-transform infrared spectroscopy, and first-principles calculations

Published:2020-08-01 Issue:8 Volume:10 Page:085212
ISSN:2158-3226
Container-title:AIP Advances
language:en
Short-container-title:AIP Advances

Author:

Onoe Jun¹^ORCID,Nakaya Masato¹^ORCID,Watanabe Shinta¹^ORCID,Nakayama Tomonobu²^ORCID,Ohno Kaoru³^ORCID,Noda Yusuke¹⁴^ORCID

Affiliation:

1. Department of Energy Science and Engineering, Nagoya University, Furo-cho, Chikusa-ku, Nagoya, Aichi 464-8603, Japan

2. International Center for Materials Nanoarchitectonics (WPI-MANA), National Institute for Materials Science, 1-1 Namiki, Tsukuba, Ibaraki 305-0044, Japan

3. Department of Physics, Yokohama National University, 79-1 Tokiwadai, Hodogaya-ku, Yokohama 240-8501, Japan

4. Department of Economic Informatics, Kanazawa Gakuin University, 10 Suemachi, Kanazawa, Ishikawa 920-1392, Japan

Funder

Japan Society for the Promotion of Science

New Energy and Industrial Technology Development Organization

Publisher

AIP Publishing

Subject

General Physics and Astronomy

Link

http://aip.scitation.org/doi/pdf/10.1063/5.0018985

Reference47 articles.