Feature single-pixel imaging: What you see is what you want

Abstract

Traditional imaging technology is basically a “what you see is what you get” imaging method, providing images that resemble human vision for post-information acquisition and interpretation. This Letter proposes a feature single-pixel imaging technique that allows for direct imaging of specific features without the need for traditional image processing methods. This approach enables the imaging of a single feature at a remarkable ultra-low sampling ratio of 2% with a resolution of up to 128 × 128 pixels, operating at a frequency of 67 Hz, even in dynamic environments where the location of the target or background features may change. Additionally, the proposed method demonstrates the ability to selectively image defects on an integrated circuit wafer. This research offers a significant advancement in the development of single-pixel imaging for feature information acquisition and has immense potential for applications in various industries and daily life scenarios.