Dual mode microwave deflection cavities for ultrafast electron microscopy-Reference-Cited by-同舟云学术

Dual mode microwave deflection cavities for ultrafast electron microscopy

Published:2018-10-15 Issue:16 Volume:113 Page:163104
ISSN:0003-6951
Container-title:Applied Physics Letters
language:en
Short-container-title:Appl. Phys. Lett.

Author:

van Rens J. F. M.¹^ORCID,Verhoeven W.¹,Kieft E. R.²,Mutsaers P. H. A.¹,Luiten O. J.¹³

Affiliation:

1. Department of Applied Physics, Coherence and Quantum Technology Group, Eindhoven University of Technology, P. O. Box 513, 5600 MB Eindhoven, The Netherlands

2. Thermo Fisher Scientific, Achtseweg Noord 5, 5651 GG Eindhoven, The Netherlands

3. Institute for Complex Molecular Systems, Eindhoven University of Technology, P.O. Box 513, 5600 MB Eindhoven, The Netherlands

Funder

Nederlandse Organisatie voor Wetenschappelijk Onderzoek

Publisher

AIP Publishing

Subject

Physics and Astronomy (miscellaneous)

Link

http://aip.scitation.org/doi/pdf/10.1063/1.5049806

Reference21 articles.

1. Nanosecond time-resolved investigations using the in situ of dynamic transmission electron microscope (DTEM)

2. Four-Dimensional Electron Microscopy

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4. Atomic-scale imaging of ultrafast materials dynamics

5. Highly Coherent Electron Beam from a Laser-Triggered Tungsten Needle Tip

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