Internal resonance based sensing in non-contact atomic force microscopy
Author:
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.4739416
Reference13 articles.
1. Quantitative analysis of dynamic-force-spectroscopy data on graphite(0001) in the contact and noncontact regimes
2. Enhanced compositional sensitivity in atomic force microscopy by the excitation of the first two flexural modes
3. Site-specific atomic scale analysis of solute segregation to a coincidence site lattice grain boundary
4. Triple-frequency intermittent contact atomic force microscopy characterization: Simultaneous topographical, phase, and frequency shift contrast in ambient air
5. An atomic force microscope tip designed to measure time-varying nanomechanical forces
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