Mechanical properties of elementary layers involved in a multilayer optical stack by photon-acoustic phonon interaction approaches-Reference-Cited by-同舟云学术

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Mechanical properties of elementary layers involved in a multilayer optical stack by photon-acoustic phonon interaction approaches

Published:2018-09-28 Issue:12 Volume:124 Page:125307
ISSN:0021-8979
Container-title:Journal of Applied Physics
language:en
Short-container-title:Journal of Applied Physics

Author:

Faëse Frédéric¹,Poinot Cherroret Delphine²,Chatel Sébastien²,Becerra Loic¹,Challali Fatiha³,Djemia Philippe³^ORCID,Belliard Laurent¹

Affiliation:

1. Institut des NanoSciences de Paris, UMR 7588, CNRS, UPMC, 4 place Jussieu, Paris 75005, France

2. Essilor International, R&D, 81 Boulevard Jean-Baptiste Oudry, 94000 Créteil, France

3. Université Paris 13, Sorbonne Paris Cité, Laboratoire des Sciences des Procédés et des Matériaux, CNRS, F-93430 Villetaneuse, France

Funder

LABEX MATISSE

LABEX SEAM

Publisher

AIP Publishing

Subject

General Physics and Astronomy

Link

http://aip.scitation.org/doi/pdf/10.1063/1.5030749

Reference28 articles.

1. Ophthalmic lens coatings

2. Channel cracks in atomic-layer and molecular-layer deposited multilayer thin film coatings

3. Measurement of hardness and elastic modulus by instrumented indentation: Advances in understanding and refinements to methodology

4. Mesure de module d’Young d’un film mince à partir de mesures expérimentales de nanoindentation réalisées sur des systèmes multicouches

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1. Ultrasonic and Spectroscopic Techniques for the Measurement of the Elastic Properties of Nanoscale Materials;Nanomechanics - Theory and Application;2021-11-17

2. Atomic force microscopy for nanoscale mechanical property characterization;Journal of Vacuum Science & Technology B;2020-11

3. Elastic properties of α- and β-tantalum thin films;Thin Solid Films;2019-10

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