Deformation stacking fault probability and dislocation microstructure of cold worked Cu–Sn–5Zn alloys by x-ray diffraction line profile analysis-Reference-Cited by-同舟云学术

Deformation stacking fault probability and dislocation microstructure of cold worked Cu–Sn–5Zn alloys by x-ray diffraction line profile analysis

Published:2006-10 Issue:7 Volume:100 Page:073509
ISSN:0021-8979
Container-title:Journal of Applied Physics
language:en
Short-container-title:Journal of Applied Physics

Author:

Dey S. N.,Chatterjee P.,Sen Gupta S. P.

Publisher

AIP Publishing

Subject

General Physics and Astronomy

Link

http://aip.scitation.org/doi/pdf/10.1063/1.2356906

Reference30 articles.

1. III. Dislocation densities in some annealed and cold-worked metals from measurements on the X-ray debye-scherrer spectrum

2. C. N. J. Wagner, in Local Atomic Arrangements Studied by X-ray Diffraction, edited by J. B. Cohen and J. E. Hillard (Addison-Wisley, Reading, MA, 1966), Chap. 7, p. 219.

3. X-ray diffraction analysis of stacking and twin faults in f.c.c. metals: a revision and allowance for texture and non-uniform fault probabilities

4. Crystallite size distribution and dislocation structure determined by diffraction profile analysis: principles and practical application to cubic and hexagonal crystals

5. The effect of dislocation contrast on x‐ray line broadening: A new approach to line profile analysis

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