Plug “n” play scanning probe microscopy
Author:
Publisher
AIP Publishing
Subject
Instrumentation
Reference13 articles.
1. An easily operable scanning tunneling microscope
2. A combined scanning tunnelling and field ion microscope
3. Coarse tip distance adjustment and positioner for a scanning tunneling microscope
4. Application of the needle sensor for microstructure measurements and atomic force microscopy
5. Application and calibration of a quartz needle sensor for high resolution scanning force microscopy
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