Spring constant calibration of atomic force microscope cantilevers of arbitrary shape-Reference-Cited by-同舟云学术

Spring constant calibration of atomic force microscope cantilevers of arbitrary shape

Published:2012-10 Issue:10 Volume:83 Page:103705
ISSN:0034-6748
Container-title:Review of Scientific Instruments
language:en
Short-container-title:Review of Scientific Instruments

Author:

Sader John E.,Sanelli Julian A.,Adamson Brian D.,Monty Jason P.,Wei Xingzhan,Crawford Simon A.,Friend James R.,Marusic Ivan,Mulvaney Paul,Bieske Evan J.

Publisher

AIP Publishing

Subject

Instrumentation

Link

http://aip.scitation.org/doi/pdf/10.1063/1.4757398

Reference53 articles.

1. Dynamic atomic force microscopy methods

2. Advances in atomic force microscopy

3. Force measurements with the atomic force microscope: Technique, interpretation and applications

4. Theoretical analysis of the static deflection of plates for atomic force microscope applications

5. Lateral, normal, and longitudinal spring constants of atomic force microscopy cantilevers

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