Jitter-calibrated second-order correlation measurement for pulsed excitation with low repetition rate

Abstract

Second-order correlation [[Formula: see text]] measurement has been utilized to characterize a nanolaser with high spontaneous emission coupling factor. Pulse excitation with low repetition rate is usually preferred for nanolasers due to its heat accumulation or photobleaching induced problem; however, introducing pulse-to-pulse timing jitter issue hinders the [Formula: see text] measurement from functioning. Here, a jitter-calibrated method is proposed by adding an extra reference time channel so that the [Formula: see text] can be calculated accurately. To verify the validity of this calibration method, the lasing threshold of a CdSe nanowire excited by a pulsed laser with a repetition rate of 1 kHz is studied. The descent of [Formula: see text] to 1 coincides with the kink in light-in vs light-out curve, which confirms the effectiveness of this method.