Author:
Hoang H. H.,Nikkel E. L.,McDavid J. M.,MacNaughton R. B.
Subject
General Physics and Astronomy
Cited by
15 articles.
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1. Massive-Scale Statistical Studies for Electromigration;Electromigration in Metals;2022-04-30
2. Experimental study of gate oxide early-life failures;2009 IEEE International Reliability Physics Symposium;2009-04
3. Statistical analysis of early failures in electromigration;Journal of Applied Physics;2001-07-15
4. Detection and analysis of early failures in electromigration;Applied Physics Letters;2000-02-14
5. Electromigration;Wiley Encyclopedia of Electrical and Electronics Engineering;1999-12-27