Analysis of the lateral resolution of electrostatic force gradient microscopy
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.4752430
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1. Growth of nanowire superlattice structures for nanoscale photonics and electronics
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3. Charging and discharging processes of carbon nanotubes probed by electrostatic force microscopy
4. Measurements of electric potential in a laser diode by Kelvin Probe Force Microscopy
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