Structure of self-assembled layers on silicon: Combined use of spectroscopic variable angle ellipsometry, neutron reflection, and atomic force microscopy-Reference-Cited by-同舟云学术

Structure of self-assembled layers on silicon: Combined use of spectroscopic variable angle ellipsometry, neutron reflection, and atomic force microscopy

Published:1999-01-15 Issue:2 Volume:85 Page:868-875
ISSN:0021-8979
Container-title:Journal of Applied Physics
language:en
Short-container-title:Journal of Applied Physics

Author:

Styrkas D. A.,Keddie J. L.,Lu J. R.,Su T. J.,Zhdan P. A.

Publisher

AIP Publishing

Subject

General Physics and Astronomy

Link

http://aip.scitation.org/doi/pdf/10.1063/1.369205

Reference26 articles.

1. Organized monolayers by adsorption. 1. Formation and structure of oleophobic mixed monolayers on solid surfaces

2. Structure and tribological properties of ultrathin alkylsilane films chemisorbed to solid surfaces

3. The structure of self-assembled monolayers of alkylsiloxanes on silicon: a comparison of results from ellipsometry and low-angle x-ray reflectivity

4. Friction and wear of self-assembled trichlorosilane monolayer films on silicon

5. Silanation of silica surfaces. A new method of constructing pure or mixed monolayers

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