Effects of grain-boundary potential barrier height and its fluctuation on conductivity of polycrystalline semiconductors in the ionized-impurity-scattering dominated case
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.4816795
Reference39 articles.
1. Carrier mobility and field effect in thin indium antimode films
2. Effects of interface‐potential nonuniformities on carrier transport across silicon grain boundaries
3. Origin of Curved Arrhenius Plots for the Conductivity of Polycrystalline Semiconductors
4. Conduction model covering non-degenerate through degenerate polycrystalline semiconductors with non-uniform grain-boundary potential heights based on an energy filtering model
5. Analysis of temperature dependence of electrical conductivity in degenerate n-type polycrystalline InAsP films in an energy-filtering model with potential fluctuations at grain boundaries
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