Terahertz scattering-type near-field microscopy quantitatively determines the conductivity and charge carrier density of optically doped and impurity-doped silicon
Author:
Affiliation:
1. Physikalisches Institut, Max-von-Laue-Straße 1, Johann Wolfgang Goethe-Universität, 60438 Frankfurt am Main, Germany
Funder
Adolf Messer Stiftung
LOEWE3 Program
Publisher
AIP Publishing
Subject
Computer Networks and Communications,Atomic and Molecular Physics, and Optics
Link
https://aip.scitation.org/doi/pdf/10.1063/5.0070608
Reference62 articles.
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5. Anisotropic excitation of surface plasmon polaritons on a metal film by a scattering-type scanning near-field microscope with a non-rotationally-symmetric probe tip
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