Deep level transient spectroscopy on as-grown and electron-irradiated p-type 4H-SiC epilayers
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.2730569
Reference26 articles.
1. Step-controlled epitaxial growth of SiC: High quality homoepitaxy
2. SiC Power Devices – An Overview
3. HTCVD Grown Semi-Insulating SiC Substrates
4. Sublimation-Grown Semi-Insulating SiC for High Frequency Devices
5. Comparison of gold, platinum, and electron irradiation for controlling lifetime in power rectifiers
Cited by 77 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
1. Depth profiles of electron and hole traps generated by reactive ion etching near the surface of 4H-SiC;Journal of Applied Physics;2024-09-06
2. Core-level photoelectron spectroscopy study on the buffer-layer formed in approximately atmospheric pressure argon on n-type and semi-insulating SiC(0001);Surface Science;2023-07
3. Electrically active traps in 4H-silicon carbide (4H-SiC) PiN power diodes;Journal of Materials Science: Materials in Electronics;2023-06
4. The initial oxidation of the 4H-SiC (0001) surface with C-related point defects: Insight by first-principles calculations;Applied Surface Science;2023-03
5. The impacts of hydrogen annealing on the carrier lifetimes in p-type 4H-SiC after thermal oxidation;Chinese Physics B;2022-08-16
1.学者识别学者识别
2.学术分析学术分析
3.人才评估人才评估
"同舟云学术"是以全球学者为主线,采集、加工和组织学术论文而形成的新型学术文献查询和分析系统,可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容,当前同舟云学术共收录了国内外主流学术期刊6万余种,收集的期刊论文及会议论文总量共计约1.5亿篇,并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询!咨询电话:010-8811{复制后删除}0370
www.globalauthorid.com
TOP
Copyright © 2019-2024 北京同舟云网络信息技术有限公司 京公网安备11010802033243号 京ICP备18003416号-3