Two-dimensional refractive index profiling by using differential near-field scanning optical microscopy
Author:
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.2769396
Reference11 articles.
1. An improved procedure to calculate the refractive index profile from the measured near-field intensity
2. Secondary‐ion‐mass spectrometry and near‐field studies of Ti:LiNbO3optical waveguides
3. Improved near-field method for refractive index measurement of optical waveguides
4. A finite differences method for the reconstruction of refractive index profiles from near-field measurements
5. Imaging local index variations in an optical waveguide using a tapping-mode near-field scanning optical microscope
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