The role of small‐impact‐parameter electron‐loss processes on ion temperatures measured by active‐beam plasma diagnostics-Reference-Cited by-同舟云学术

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The role of small‐impact‐parameter electron‐loss processes on ion temperatures measured by active‐beam plasma diagnostics

Published:1989-01 Issue:1 Volume:65 Page:57-63
ISSN:0021-8979
Container-title:Journal of Applied Physics
language:en
Short-container-title:Journal of Applied Physics

Author:

Donné A. J. H.,de Heer F. J.,Olson R. E.

Publisher

AIP Publishing

Subject

General Physics and Astronomy

Link

http://aip.scitation.org/doi/pdf/10.1063/1.343375

Reference25 articles.

1. On the application of the Rutherford‐scattering diagnostics to ion temperature measurements

2. Active Beam Scattering Method for Measurement of Ion Temperature in JFT-2 Tokamak Plasma

Cited by 4 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Chapter 8: Particle Diagnostics;Fusion Science and Technology;2008-02

2. Ion sources for fusion plasma diagnostics;IEEE Transactions on Plasma Science;2005-12

3. Rutherford scattering at TEXTOR;Review of Scientific Instruments;1992-10

4. Ion temperature measurements in tokamak plasmas by Rutherford scattering;Review of Scientific Instruments;1992-06

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