Evolution of implantation induced damage under further ion irradiation: Influence of damage type
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.3086313
Reference78 articles.
1. Ion implantation of silicon and germanium at room temperature. Analysis by means of 1.0-MeV helium ion scattering
2. Comparison of results and models of solid-phase epitaxial growth of implanted Si layers induced by electron- and ion-beam irradiation
3. Anomalous reduction of stage-I recovery in nickel irradiated with heavy ions in the energy range100–120MeV
4. Electron beam stimulated nonthermal crystallization of CdS surface layers: Observations by real‐time atomic‐resolution electron microscopy
Cited by 7 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
1. Enhanced surface blistering efficiency of H+ implanted lithium tantalate by chemical reduction modification;Applied Surface Science;2023-06
2. Au 9+ swift heavy ion irradiation of Zn[CS(NH 2 ) 2 ] 3 SO 4 crystal: Crystalline perfection and optical properties;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2014-11
3. Neutron-enhanced annealing of ion-implantation induced damage in silicon heated by nuclear reactions;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2014-09
4. Effect of thiourea on grain refinement and defect structure of the pulsed electrodeposited nanocrystalline copper;Surface and Coatings Technology;2013-01
5. The effects of Xe irradiation on He and H co-implanted Si;Radiation Effects and Defects in Solids;2012-03
1.学者识别学者识别
2.学术分析学术分析
3.人才评估人才评估
"同舟云学术"是以全球学者为主线,采集、加工和组织学术论文而形成的新型学术文献查询和分析系统,可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容,当前同舟云学术共收录了国内外主流学术期刊6万余种,收集的期刊论文及会议论文总量共计约1.5亿篇,并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询!咨询电话:010-8811{复制后删除}0370
www.globalauthorid.com
TOP
Copyright © 2019-2024 北京同舟云网络信息技术有限公司 京公网安备11010802033243号 京ICP备18003416号-3