Symmetry breaking and excitonic effects on optical properties of defective nanographenes
Author:
Affiliation:
1. Institute for Solid State Physics, The University of Tokyo, 5-1-5 Kashiwanoha, Kashiwa, Chiba 277-8581, Japan
Funder
Japan Society for the Promotion of Science (JSPS)
Publisher
AIP Publishing
Subject
Physical and Theoretical Chemistry,General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.4907751
Reference51 articles.
1. Electronic structures of graphene edges and nanographene
2. Lithium-Cation/π Complexes of Aromatic Systems. The Effect of Increasing the Number of Fused Rings
3. Atomically precise edge chlorination of nanographenes and its application in graphene nanoribbons
4. Electronic State of Oxidized Nanographene Edge with Atomically Sharp Zigzag Boundaries
5. Size-selective synthesis of [9]–[11] and [13]cycloparaphenylenes
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