General Method of Treating Instrumental Distortion of Spectral Data with Applications to X‐Ray Physics
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.1708559
Reference16 articles.
1. The Determination of X-Ray Line Shapes by a Double Crystal Spectrometer
2. The Determination of X-Ray Diffraction Line Widths
3. The Shape of X-Ray Diffraction Lines from Colloidal Magnesium Oxide
4. A Numerical Fourier-analysis Method for the Correction of Widths and Shapes of Lines on X-ray Powder Photographs
5. Optimized Method for Correcting Smearing Aberrations: Complex X‐Ray Spectra
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