High-resolution setup for measuring wavelength sensitivity of photoyellowing of translucent materials-Reference-Cited by-同舟云学术

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High-resolution setup for measuring wavelength sensitivity of photoyellowing of translucent materials

Published:2015-10 Issue:10 Volume:86 Page:103103
ISSN:0034-6748
Container-title:Review of Scientific Instruments
language:en
Short-container-title:Review of Scientific Instruments

Author:

Vaskuri Anna¹,Kärhä Petri¹,Heikkilä Anu²,Ikonen Erkki¹³

Affiliation:

1. Metrology Research Institute, Aalto University, P.O. Box 13000, FI-00076 Aalto, Finland

2. R&D/Climate Research, Finnish Meteorological Institute, P.O. Box 503, FI-00101 Helsinki, Finland

3. MIKES Metrology, VTT Technical Research Centre of Finland Ltd., P.O. Box 1000, FI-02044 VTT, Finland

Funder

Suomen Akatemia (Academy of Finland)

Publisher

AIP Publishing

Subject

Instrumentation

Link

http://aip.scitation.org/doi/pdf/10.1063/1.4931682

Reference26 articles.

1. Modeling Photodegradation in Transparent Polymers

2. Sunlight stability of organic light-emitting diodes

3. Consequences of stratospheric ozone depletion and climate change on the use of materials

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