Molecular dynamics investigation of hexagonal boron nitride sputtering and sputtered particle characteristics
Author:
Affiliation:
1. Department of Aerospace Engineering, University of Michigan, Ann Arbor, Michigan 48109, USA
Funder
National Aeronautics and Space Administration (NASA)
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.4958869
Reference26 articles.
1. Hexagonal boron nitride: Fabrication, properties and applications
2. Total and differential sputter yields of boron nitride measured by quartz crystal microbalance
3. Low-energy xenon ion sputtering of ceramics investigated for stationary plasma thrusters
4. Ionization of boron, aluminum, gallium, and indium by electron impact
5. A. Yalin , V. Surla , C. Farnell , M. Butweiller , and J. Williams , “ Sputtering studies of multi-component materials by weight loss and cavity ring-down spectroscopy,” in 42nd AIAA/ASME/SAE/ASEE Joint Propulsion Conference & Exhibit, Sacramento, California, USA, July 2006.
Cited by 4 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
1. Ion irradiation-induced sputtering and surface modification of BN films prepared by a reactive plasma-assisted coating technique;Japanese Journal of Applied Physics;2022-06-13
2. A linked-scale coupled model of mass erosion and redistribution in plasma-exposed micro-foam surfaces;Journal of Nuclear Materials;2021-09
3. Characterization of surface modification mechanisms for boron nitride films under plasma exposure;Surface and Coatings Technology;2019-11
4. Hybrid–PIC simulation of sputtering product distribution in a Hall thruster;Plasma Science and Technology;2017-08-21
1.学者识别学者识别
2.学术分析学术分析
3.人才评估人才评估
"同舟云学术"是以全球学者为主线,采集、加工和组织学术论文而形成的新型学术文献查询和分析系统,可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容,当前同舟云学术共收录了国内外主流学术期刊6万余种,收集的期刊论文及会议论文总量共计约1.5亿篇,并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询!咨询电话:010-8811{复制后删除}0370
www.globalauthorid.com
TOP
Copyright © 2019-2024 北京同舟云网络信息技术有限公司 京公网安备11010802033243号 京ICP备18003416号-3