Super-resolution reconstruction of structured illumination microscopy based on pixel reassignment

Author:

Liu Xing123ORCID,Fang Xiang123ORCID,Lei Yunze123ORCID,Li Jiaoyue123ORCID,An Sha123ORCID,Zheng Juanjuan1234ORCID,Ma Ying123ORCID,Ma Haiyang123ORCID,Zalevsky Zeev5ORCID,Gao Peng123ORCID

Affiliation:

1. School of Physics, Xidian University 1 , Xi'an 710071, China

2. Key Laboratory of Optoelectronic Perception of Complex Environment, Ministry of Education 2 , Xi'an 710071, China

3. Engineering Research Center of Information Nanomaterials, Universities of Shaanxi Province 3 , Xi'an 710071, China

4. State Key Laboratory of Transient Optics and Photonics, Xi'an Institute of Optics and Precision Mechanics, Chinese Academy of Sciences 4 , Xi'an 710119, China

5. Faculty of Engineering and Nano Technology Center, Bar-Ilan University 5 , Ramat-Gan 5290002, Israel

Abstract

In this work, we report a pixel reassignment based super-resolution reconstruction algorithm for structured illumination microscopy (entitled PR-SIM). PR-SIM provides a twofold theoretical resolution enhancement by reassigning the pixels in raw SIM images with respect to the center of each illumination fringe and applying further deconvolution. By comparing with frequency domain based algorithms, PR-SIM is more immune to fringe distortion and, hence, it is more suited for large-field SIM in that it processes the raw images locally. Meanwhile, the reconstruction speed of PR-SIM can be enhanced by skipping empty regions in the image and further enhanced by employing GPU-base parallel calculation. Overall, we can envisage that the PR-SIM can be extended for other illumination modulation based microscopic techniques.

Funder

National Key Research and Development Program of China

National Natural Science Foundation of China

Natural Science Foundation of Shaanxi Province

Fundamental Research Funds for the Central Universities

Publisher

AIP Publishing

Subject

Physics and Astronomy (miscellaneous)

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