Short-circuit current density imaging of crystalline silicon solar cells via lock-in thermography: Robustness and simplifications
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.4901268
Reference39 articles.
1. Lock-in Thermography
2. Realistic evaluation of power losses in solar cells by using thermographic methods
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4. Light-modulated lock-in thermography for photosensitivepn-structures and solar cells
5. Photographic surveying of minority carrier diffusion length in polycrystalline silicon solar cells by electroluminescence
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1. Fundamental Aspects Concerning the Validity of the Standard Equivalent Circuit for Large‐Area Silicon Solar Cells;physica status solidi (a);2019-12-22
2. Detecting Defects in Photovoltaic Cells and Panels and Evaluating the Impact on Output Performances;IEEE Transactions on Instrumentation and Measurement;2016-05
3. An empirical method for imaging the short circuit current density in silicon solar cells based on dark lock-in thermography;Solar Energy Materials and Solar Cells;2015-12
4. Short-circuit Current Density Imaging Methods for Silicon Solar Cells;Energy Procedia;2015-08
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