Phase modulation atomic force microscope with true atomic resolution
Author:
Publisher
AIP Publishing
Subject
Instrumentation
Link
http://aip.scitation.org/doi/pdf/10.1063/1.2405361
Reference23 articles.
1. Atomic force microscope–force mapping and profiling on a sub 100‐Å scale
2. Frequency modulation detection using high‐Qcantilevers for enhanced force microscope sensitivity
3. Fractured polymer/silica fiber surface studied by tapping mode atomic force microscopy
4. Nanometer-Scale Characterization of Ferroelectric Polymer Thin Films by Variable-Temperature Atomic Force Microscopy
5. Structures and local electrical properties of ferroelectric polymer thin films in thermal process investigated by dynamic-mode atomic force microscopy
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