XFEL coherent diffraction imaging for weakly scattering particles using heterodyne interference-Reference-Cited by-同舟云学术

XFEL coherent diffraction imaging for weakly scattering particles using heterodyne interference

Published:2020-05-01 Issue:5 Volume:10 Page:055219
ISSN:2158-3226
Container-title:AIP Advances
language:en
Short-container-title:AIP Advances

Author:

Huang Chi-Feng¹,Chang Wei-Hau¹²^ORCID,Lee Ting-Kuo¹^ORCID,Joti Yasumasa³^ORCID,Nishino Yoshinori⁴^ORCID,Kimura Takashi⁴,Suzuki Akihiro⁴^ORCID,Bessho Yoshitaka¹^ORCID,Lee Tsung-Tse¹,Chen Mei-Chun¹,Yang Shun-Min¹,Hwu Yeukuang¹^ORCID,Huang Shih-Hsin²^ORCID,Li Po-Nan¹^ORCID,Chen Peilin⁵^ORCID,Tseng Yung-Chieh⁶,Ma Che⁶^ORCID,Hsu Tsui-Ling⁶,Wong Chi-Huey⁶,Tono Kensuke⁷,Ishikawa Tetsuya⁷^ORCID,Liang Keng S.¹

Affiliation:

1. Institute of Physics, Academia Sinica, Taipei 115, Taiwan

2. Institute of Chemistry, Academia Sinica, Taipei 115, Taiwan

3. Japan Synchrotron Radiation Research Institute/Spring-8, Hyogo 679-5198, Japan

4. Research Institute for Electronic Science, Hokkaido University, Sapporo 001-0021, Japan

5. Research Center for Applied Sciences, Academia Sinica, Taipei 115, Taiwan

6. Genomics Research Center, Academia Sinica, Taipei 115, Taiwan

7. RIKEN SPring-8 Center, Hyogo 679-5148, Japan

Funder

The Network Joint Research Center for Materials and Devices

Ministry of Science and Technology, Taiwan

Japan Society for the Promotion of Science

Japan Synchrotron Radiation Research Institute

Publisher

AIP Publishing

Subject

General Physics and Astronomy

Link

http://aip.scitation.org/doi/pdf/10.1063/1.5129406

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