Transmission secondary ion mass spectrometry using 5 MeV C60+ ions

Author:

Nakajima K.,Nagano K.,Suzuki M.,Narumi K.,Saitoh Y.,Hirata K.,Kimura K.

Publisher

AIP Publishing

Subject

Physics and Astronomy (miscellaneous)

Cited by 7 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. MeV Cluster Ion Beam–Material Interaction;Quantum Beam Science;2022-01-24

2. Effects of molecular axis orientation of MeV diatomic projectiles on secondary ion emission from biomolecular targets;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2020-09

3. Electron-loss and destruction processes in collision of MeV/atom carbon cluster ions with rare gases;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2020-09

4. The sputtering yield of crystalline Si(1 0 0) surface by monoatomic and diatomic nitrogen ions impact;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2019-12

5. Investigation of the energy loss of I in Au at energies below the Bragg peak;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2019-07

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